• DocumentCode
    2327784
  • Title

    Spectral terahertz topography

  • Author

    Ewers, Benjamin ; Kupsch, Andreas

  • Author_Institution
    Fed. Inst. for Mater. Res. & Testing (BAM), Berlin, Germany
  • fYear
    2009
  • fDate
    21-25 Sept. 2009
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    THz-time domain spectroscopy (TDS) is utilised for spectrally resolved topography. Beyond pure imaging we employ a reflection set-up in order to demonstrate capabilities of computing 3D volume data for components of everyday communication electronics. The technique´s potentials in Non-Destructive Testing (NDT) are explored with respect to established methods.
  • Keywords
    nondestructive testing; terahertz wave spectra; 3D volume data; communication electronics; nondestructive testing; spectrally resolved topography; terahertz-time domain spectroscopy; Surfaces;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Infrared, Millimeter, and Terahertz Waves, 2009. IRMMW-THz 2009. 34th International Conference on
  • Conference_Location
    Busan
  • Print_ISBN
    978-1-4244-5416-7
  • Electronic_ISBN
    978-1-4244-5417-4
  • Type

    conf

  • DOI
    10.1109/ICIMW.2009.5325741
  • Filename
    5325741
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2327784