DocumentCode
2327789
Title
Detection ability of parametric faults in Analog circuits using CBT concept and its Test limitations
Author
Hossain, Md Delowar ; Ganguly, Tanay Kumar ; Jahan, Sarwar ; Hossain, M. Mofazzal
Author_Institution
Dept. of Electr. & Electron. Eng., Dhaka Univ. of Eng. & Technol., Dhaka, Bangladesh
fYear
2010
fDate
18-20 Dec. 2010
Firstpage
446
Lastpage
449
Abstract
This paper represents the CBT (Co-efficient-based Test) technique to determine parametric faults mainly for a higher order low pass filter. We found that by varying signal to noise ratio as well as considering noise generated by all the elements, results a different transfer function. And from the coefficient value of that deviated transfer function, it is easy to detect faults also in practical cases. Noise generated by capacitances is also considered in the present work.
Keywords
analogue circuits; low-pass filters; analog circuit; co-efficient-based test; detection ability; low pass filter; parametric fault; signal to noise ratio; transfer function; Bode diagram; LNAPTF; Monte Carlo Simulation; Parametric faults; transfer function;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical and Computer Engineering (ICECE), 2010 International Conference on
Conference_Location
Dhaka
Print_ISBN
978-1-4244-6277-3
Type
conf
DOI
10.1109/ICELCE.2010.5700725
Filename
5700725
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