Title :
Terahertz characterization of interfacial oxide layers and voids for health monitoring of ceramic coatings
Author :
Chen, Chia-Chu ; Lee, Dong-Joon ; Pollock, Tresa ; Whitaker, John F.
Author_Institution :
Electr. Eng. & Comput. Sci., Univ. of Michigan, Ann Arbor, MI, USA
Abstract :
Terahertz time-domain reflectometry was used to monitor the progress of a thermally grown oxide layer and the resulting air-voids at the interface of an Yttria-stabilized-zirconia ceramic coating and a conductive metal surface. Experimental terahertz-pulse delays were compared to time-domain simulations and scanning-electron-microscope images.
Keywords :
ceramics; condition monitoring; flaw detection; terahertz wave spectra; thermal barrier coatings; time-domain reflectometry; voids (solid); yttrium compounds; zirconium compounds; Y2O3-ZrO2; conductive metal surface; health monitoring; interfacial oxide layers; scanning-electron-microscopy; terahertz time-domain reflectometry; terahertz-pulse delays; thermal-barrier coatings; thermally grown oxide layer; time-domain simulations; voids; yttria-stabilized-zirconia ceramic coating; Ceramics; Coatings; Intrusion detection; Laser theory; Materials science and technology; Monitoring; Optical pulses; Oxidation; Scanning electron microscopy; Time domain analysis;
Conference_Titel :
Infrared, Millimeter, and Terahertz Waves, 2009. IRMMW-THz 2009. 34th International Conference on
Conference_Location :
Busan
Print_ISBN :
978-1-4244-5416-7
Electronic_ISBN :
978-1-4244-5417-4
DOI :
10.1109/ICIMW.2009.5325767
