Title :
Calculation of the reflection matrix in the plane waveguide by scanning screen method
Author :
Aleksandrova, I.L. ; Pleshchinskii, N.B.
Author_Institution :
Chebotarev Inst. of Math. & Mech., Kazan State Univ., Kazan
fDate :
June 29 2008-July 2 2008
Abstract :
The possibility of calculation of coefficients of the reflection matrix partially describing inhomogeneous in the plane waveguide with metallic sides by bounded number of characteristics of the reflected field is studied. To receive the additional information it is proposed to use a thin conducting screen placed in front of the investigated heterogeneity.
Keywords :
electromagnetic wave reflection; waveguide theory; plane waveguide; reflected field; reflection matrix; scanning screen method; thin conducting screen; Electromagnetic fields; Electromagnetic measurements; Electromagnetic reflection; Electromagnetic scattering; Electromagnetic waveguides; Matrix decomposition; Planar waveguides; Transmission line matrix methods; Waveguide components; Waveguide theory;
Conference_Titel :
Mathematical Methods in Electromagnetic Theory, 2008. MMET 2008. 12th International Conference on
Conference_Location :
Odesa
Print_ISBN :
978-1-4244-2284-5
DOI :
10.1109/MMET.2008.4580927
