• DocumentCode
    2328540
  • Title

    FDTD modelling of active radar absorbers

  • Author

    Chambers, B. ; Tennant, A.

  • Author_Institution
    Univ. of Sheffield, Sheffield
  • fYear
    2007
  • fDate
    9-15 June 2007
  • Firstpage
    6027
  • Lastpage
    6030
  • Abstract
    An active absorber, such as the phase-switched screen (PSS), achieves an apparent reduction in the level of the electromagnetic energy reflected from its surface by using binary phase modulation to redistribute it over a bandwidth which is much wider than that of the receiver [Chambers B. and Tennant A., 2004]. Previous analyses of the PSS have been based on either transmission-line theory [Chambers B. and Tennant A., 2004] or the Fourier series [Chambers B. and Tennant A., 2006]. The former enables the PSS reflectivity bandwidth to be estimated, whereas the latter reveals the frequency spectra of signals reflected from the PSS when different switching strategies are employed. Both these previous analyses assumed ideal switching behaviour (i.e. active layer either perfectly transparent or perfectly reflecting) and ideal binary switching waveforms (i.e. zero rise and fall times). Practical PSSs, however, use active layers consisting of arrays of PIN diode loaded resonant elements [Chambers B. and Tennant A., 2004]. Hence a more general analysis of the PSS based on Finite Difference Time Domain (FDTD) techniques is currently being investigated and initial progress is described below.
  • Keywords
    finite difference time-domain analysis; radar; FDTD modelling; active radar absorber; binary phase modulation; binary switching waveform; finite difference time domain technique; phase-switched screen; signal frequency spectra; Bandwidth; Finite difference methods; Fourier series; Frequency estimation; Phase modulation; Radar; Reflectivity; Resonance; Time domain analysis; Transmission lines;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium, 2007 IEEE
  • Conference_Location
    Honolulu, HI
  • Print_ISBN
    978-1-4244-0877-1
  • Electronic_ISBN
    978-1-4244-0878-8
  • Type

    conf

  • DOI
    10.1109/APS.2007.4396927
  • Filename
    4396927