A survey on three-dimensional modeling based on line structured light scanner

Author

Wu Qian ; Xu De ; Zou Wei

Author_Institution

Inst. of Autom., Beijing, China

fYear

2014

fDate

28-30 July 2014

Firstpage

7439

Lastpage

7444

Abstract

Three-dimensional modeling technology is a key technology in many areas of research. As a non-contact three-dimensional modeling device, line structured light scanner has the advantages of non-destructive, high precision, real-time, good anti-interference ability. This paper introduces the measuring principle of line structured light scanner and the system configuration of three-dimensional scanning system. In this paper, the key technologies in three-dimensional modeling system based on line structured light scanner are presented, including calibration of three-dimensional modeling system, strip centers extraction, structured light scanner view planning, point cloud data processing and three-dimensional reconstruction. Last, a review of the development process of structured light based three- dimensional modeling technology is presented.

Keywords

calibration; interference suppression; light interference; optical scanners; optical variables measurement; antiinterference ability; calibration; line structured light scanner; noncontact three-dimensional modeling device; point cloud data processing; strip center; structured light based three-dimensional modeling technology; three-dimensional scanning system; Charge coupled devices; Data models; Design automation; Electronic mail; Iterative closest point algorithm; Solid modeling; Three-dimensional displays; 3D modeling; Calibration; Line structured light; Path planning; Point cloud processing;

fLanguage

English

Publisher

ieee

Conference_Titel

Control Conference (CCC), 2014 33rd Chinese

Conference_Location

Nanjing

Type

conf

DOI

10.1109/ChiCC.2014.6896237

Filename

6896237