DocumentCode
2328892
Title
Inspection allocation in manufacturing systems: a genetic algorithm approach
Author
Taneja, Mukesh ; Viswanadham, N.
Author_Institution
Dept. of Comput. Sci. & Autom., Indian Inst. of Sci., Bangalore, India
fYear
1994
fDate
8-13 May 1994
Firstpage
3537
Abstract
In this paper, the authors are concerned with the problem of location of inspection centers in a multistage manufacturing system. A genetic algorithm based approach is developed to determine the location of inspection centers resulting in a minimum expected total cost. The total cost includes inspection, manufacturing and scrapping cost at each stage of the manufacturing process. A penalty cost is included in it to account for a defective item which is not detected by the inspection scheme. A set of test problems are solved using this algorithm
Keywords
genetic algorithms; inspection; operations research; optimisation; quality control; defective item; genetic algorithm approach; inspection allocation; manufacturing systems; minimum expected total cost; multistage manufacturing system; penalty cost; Algorithm design and analysis; Computer science; Costs; Genetic algorithms; Inspection; Manufacturing automation; Manufacturing processes; Manufacturing systems; Raw materials; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Robotics and Automation, 1994. Proceedings., 1994 IEEE International Conference on
Conference_Location
San Diego, CA
Print_ISBN
0-8186-5330-2
Type
conf
DOI
10.1109/ROBOT.1994.351027
Filename
351027
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