• DocumentCode
    2328892
  • Title

    Inspection allocation in manufacturing systems: a genetic algorithm approach

  • Author

    Taneja, Mukesh ; Viswanadham, N.

  • Author_Institution
    Dept. of Comput. Sci. & Autom., Indian Inst. of Sci., Bangalore, India
  • fYear
    1994
  • fDate
    8-13 May 1994
  • Firstpage
    3537
  • Abstract
    In this paper, the authors are concerned with the problem of location of inspection centers in a multistage manufacturing system. A genetic algorithm based approach is developed to determine the location of inspection centers resulting in a minimum expected total cost. The total cost includes inspection, manufacturing and scrapping cost at each stage of the manufacturing process. A penalty cost is included in it to account for a defective item which is not detected by the inspection scheme. A set of test problems are solved using this algorithm
  • Keywords
    genetic algorithms; inspection; operations research; optimisation; quality control; defective item; genetic algorithm approach; inspection allocation; manufacturing systems; minimum expected total cost; multistage manufacturing system; penalty cost; Algorithm design and analysis; Computer science; Costs; Genetic algorithms; Inspection; Manufacturing automation; Manufacturing processes; Manufacturing systems; Raw materials; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Robotics and Automation, 1994. Proceedings., 1994 IEEE International Conference on
  • Conference_Location
    San Diego, CA
  • Print_ISBN
    0-8186-5330-2
  • Type

    conf

  • DOI
    10.1109/ROBOT.1994.351027
  • Filename
    351027