• DocumentCode
    2329223
  • Title

    A TPM-Inspired Factory Throughput Analysis Tool

  • Author

    Konopka, J.

  • Author_Institution
    SEMATECH
  • fYear
    1994
  • fDate
    21-22 June 1994
  • Firstpage
    64
  • Lastpage
    67
  • Abstract
    The throughput of a factory is constrained by its bottleneck tools. TPM is a methodology that can be used to improve the efficiencies and thus the throughputs of these bottleneck tools. CUBES is a model that helps identify where improvements can be made and how much benefit can be gained from each improvement. If all bottlenecks are analyzed together, factory level throughput improvements can be made.
  • Keywords
    Availability; Circuits; Costs; Electronics industry; Manufacturing industries; Particle measurements; Production facilities; Robustness; Semiconductor device manufacture; Throughput;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Manufacturing, 1994. Extended Abstracts of ISSM '94. 1994 International Symposium on
  • Conference_Location
    Tokyo, Japan
  • Type

    conf

  • DOI
    10.1109/ISSM.1994.729425
  • Filename
    729425