• DocumentCode
    2329577
  • Title

    A low-phase-noise injection-locked differential ring-VCO with half-integral subharmonic locking in 0.18 µm CMOS

  • Author

    Kobayashi, Yuka ; Amakawa, Shuhei ; Ishihara, Noboru ; Masu, Kazuya

  • Author_Institution
    Integrated Res. Inst., Tokyo Inst. of Technol., Yokohama, Japan
  • fYear
    2009
  • fDate
    14-18 Sept. 2009
  • Firstpage
    440
  • Lastpage
    443
  • Abstract
    Design and implementation of a CMOS differential ring-VCO that locks at half-integral (1.5, 2.5, 3.5, hellip) as well as integral (1, 2, 3, hellip) multiples of the injected reference frequency fref are presented. The advantage of half-integral subharmonic locking is that, for a given VCO output frequency step, the output phase noise can be lowered than when using integral subharmonic locking because of the higher (2x) reference frequency. For example, the 1-MHz-offset phase noise at a VCO output frequency of 1.5 GHz was -136 dBc/Hz when locked to an integral subharmonic of fref = 0.5 GHz, whereas it was as low as -139 dBc/Hz when locked to a half-integral subharmonic of fref = 1.0 GHz. The ring-VCO was fabricated with a 0.18 mum CMOS process. An explanation is given as to why it locks to half-integral subharmonics and how such an oscillator could be designed. Half-integral or, more generally, nonintegral subharmonic locking could make an effective means to reduce the phase noise of high-resolution injection-locked VCOs.
  • Keywords
    CMOS integrated circuits; UHF oscillators; harmonic oscillators (circuits); injection locked oscillators; phase noise; voltage-controlled oscillators; CMOS; VCO output frequency step; frequency 1.5 GHz; half-integral subharmonic locking; injected reference frequency; low-phase-noise injection-locked differential ring; output phase noise; size 0.18 mum; Analog circuits; Bandwidth; CMOS technology; Cutoff frequency; Energy consumption; Injection-locked oscillators; Paper technology; Phase noise; Radio frequency; Voltage-controlled oscillators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ESSCIRC, 2009. ESSCIRC '09. Proceedings of
  • Conference_Location
    Athens
  • ISSN
    1930-8833
  • Print_ISBN
    978-1-4244-4354-3
  • Type

    conf

  • DOI
    10.1109/ESSCIRC.2009.5325965
  • Filename
    5325965