• DocumentCode
    2329885
  • Title

    Design Optimization Of Gas Pumping System For Ultra Clean Reduced-Gas-Pressure Processing Equipment

  • Author

    Konishi, N. ; Shibata, T. ; Ohmi, T.

  • Author_Institution
    Tohoku University
  • fYear
    1994
  • fDate
    21-22 June 1994
  • Firstpage
    213
  • Lastpage
    214
  • Abstract
    Impurity back diffusion through a UHV pump in reduced-gas-processing chambers has been experimentally studied. A large throughput of process gases severely degrades the main UHV pump capability in dragging impurities, resulting in the back diffusion of impurities to the processing chamber. Such degradation is greatly influenced by the pumping speed of the backing pump. However, we have found for the first time that the impurity level in the chamber can be made even lower than that for the best performance under UHV when the gas flow rate is optimized for the system. The scenario to the gas pumping system optimization is presented.
  • Keywords
    Degradation; Design engineering; Design optimization; Fluid flow; Gases; Helium; Impurities; Reproducibility of results; Semiconductor devices; Throughput;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Manufacturing, 1994. Extended Abstracts of ISSM '94. 1994 International Symposium on
  • Conference_Location
    Tokyo, Japan
  • Type

    conf

  • DOI
    10.1109/ISSM.1994.729459
  • Filename
    729459