DocumentCode :
2330208
Title :
An efficient algorithm for statistical circuit optimization using lagrangian relaxation
Author :
Lin, I-Jye ; Chang, Yao-Wen
Author_Institution :
Nat. Taiwan Univ., Taipei
fYear :
2007
fDate :
4-8 Nov. 2007
Firstpage :
119
Lastpage :
124
Abstract :
Due to the technology scaling down, process variation has become a crucial challenge on both interconnect delay and reliability. To handle the process variation, statistical optimization has emerged as a popular technique for yield improvement. As a relatively new technique, second-order conic programming (SOCP) has recently attracted very much attention in the literature for statistical circuit optimization. However, we observe significant limitations of SOCP in its flexibility, accuracy, and scalability for statistical circuit optimization, especially when interconnects are considered. We thus present in this paper an effective and efficient alternative for multi-constrained statistical circuit optimization by both gate and wire sizing using Lagrangian relaxation (LR). Compared with SOCP, experimental results show that our LR-based algorithm can achieve much better solution quality by reducing 21% area and obtain 560X speed-up over SOCP.
Keywords :
VLSI; circuit optimisation; integrated circuit reliability; statistical analysis; Lagrangian relaxation; process variation; second-order conic programming; statistical circuit optimization; Circuit optimization; Delay; Integrated circuit interconnections; Integrated circuit reliability; Integrated circuit technology; Lagrangian functions; Scalability; Timing; Very large scale integration; Wire;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer-Aided Design, 2007. ICCAD 2007. IEEE/ACM International Conference on
Conference_Location :
San Jose, CA
ISSN :
1092-3152
Print_ISBN :
978-1-4244-1381-2
Electronic_ISBN :
1092-3152
Type :
conf
DOI :
10.1109/ICCAD.2007.4397253
Filename :
4397253
Link To Document :
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