DocumentCode :
2330481
Title :
Extending systems-on-chip to the third dimension: performance, cost and technological tradeoffs
Author :
Weerasekera, Roshan ; Zheng, Li-Rong ; Pamunuwa, Dinesh ; Tenhunen, Hannu
Author_Institution :
ELECTRUM 229, Kista
fYear :
2007
fDate :
4-8 Nov. 2007
Firstpage :
212
Lastpage :
219
Abstract :
Because of the today´s market demand for high-performance, high-density portable hand-held applications, electronic system design technology has shifted the focus from 2-D planar SoC single-chip solutions to different alternative options as tiled silicon and single-level embedded modules as well as 3-D integration. Among the various choices, finding an optimal solution for system implementation dealt usually with cost, performance and other technological trade-off analysis at the system conceptual level. It has been identified that the decisions made within the first 20% of the total design cycle time will ultimately result up to 80% of the final product cost. In this paper, we discuss appropriate and realistic metric for performance and cost trade-off analysis both at system conceptual level (up-front in the design phase) and at implementation phase for verification in the three-dimensional integration. In order to validate the methodology, two ubiquitous electronic systems are analyzed under various implementation schemes and discuss the pros and cons of each of them.
Keywords :
semiconductor device manufacture; system-on-chip; 2D planar SoC single-chip solutions; cost trade-off analysis; design cycle time; electronic system design technology; high-density portable hand-held applications; single-level embedded modules; system conceptual level; systems-on-chip; tiled silicon; Circuit noise; Cost function; Dielectric substrates; Fabrication; Integrated circuit interconnections; Performance analysis; Power system interconnection; Radio frequency; Routing; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer-Aided Design, 2007. ICCAD 2007. IEEE/ACM International Conference on
Conference_Location :
San Jose, CA
ISSN :
1092-3152
Print_ISBN :
978-1-4244-1381-2
Electronic_ISBN :
1092-3152
Type :
conf
DOI :
10.1109/ICCAD.2007.4397268
Filename :
4397268
Link To Document :
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