Title :
An incremental learning framework for estimating signal controllability in unit-level verification
Author :
Wen, Charles H P ; Wang, Li.-C. ; Bhadra, Jayanta
Author_Institution :
Nat. Chiao-Tung Univ., Hsinchu
Abstract :
Unit-level verification is a critical step to the success of full-chip functional verification for microprocessor designs. In the unit-level verification, a unit is first embedded in a complex software that emulates the behavior of surrounding units, and then a sequence of stimuli is applied to measure the functional coverage. In order to generate such a sequence, designers need to comprehend the relationship between boundaries at the unit under verification and at the inputs to the emulation software. However, figuring out this relationship can be very difficult. Therefore, this paper proposes an incremental learning framework that incorporates an ordered-binary-decision-forest(OBDF) algorithm, to automate estimating the controllability of unit-level signals and to provide full-chip level information for designers to govern these signals. Mathematical analysis shows that the proposed OBDF algorithm has lower model complexity and lower error variance than the previous algorithms. Meanwhile, a commercial microprocessor core is also applied to demonstrate that controllability of input signals on the load/store unit in the microprocessor core can be estimated automatically and information about how to govern these signals can also be extracted successfully.
Keywords :
binary decision diagrams; controllability; learning (artificial intelligence); logic CAD; microprocessor chips; full-chip functional verification; incremental learning framework; microprocessor designs; ordered-binary-decision-forest; signal controllability; stimuli sequence; unit-level verification; Algorithm design and analysis; Controllability; Data mining; Embedded software; Emulation; Mathematical analysis; Mathematical model; Microprocessors; Signal design; Software measurement;
Conference_Titel :
Computer-Aided Design, 2007. ICCAD 2007. IEEE/ACM International Conference on
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4244-1381-2
Electronic_ISBN :
1092-3152
DOI :
10.1109/ICCAD.2007.4397274