Title :
UWB and Wideband Channel Models for Working Machine Environment
Author :
Taparugssanagorn, Attaphongse ; Hämäläinen, Matti ; Iinatti, Jari
Author_Institution :
Centre for Wireless Commun., Univ. of Oulu, Oulu, Finland
Abstract :
In this paper, we present statistical models for wideband and ultra-wideband (UWB) radio channels for working machine cabin environment. Based on a set of measurements, it was found that such a small and confined space causes mostly diffuse multipath scattering rather than specular paths. The amplitude of the channel impulse responses in the wideband case is mostly Rayleigh distributed small-scale fading signal, with only few paths exhibiting Ricean distributions, whereas the ones in the UWB case tend to be log-normally distributed. For the path amplitude, we suggest an exponential decay profile, which has a constant slope in dB scale, with the corresponding parameters for the UWB case. For the wideband case, a two-fold exponential decay profile provides excellent fits to the measured data. It was also noted that the root-mean-square (RMS) delay spread is independent of line-of-sight (LOS)/obstructed line-of-sight (OLOS) situations of the channel. The multipath components contributing significant energy play a major role in such a small environment if compared to the direct path. In addition, the radio channel gains are attenuated with the presence of a driver inside the cabin.
Keywords :
Rayleigh channels; Rician channels; exponential distribution; log normal distribution; mobile radio; multipath channels; ultra wideband communication; Rayleigh distributed small-scale fading signal; Ricean distribution; UWB channel model; channel impulse response; exponential decay profile; log normal distribution; multipath scattering; root mean square delay spread; statistical model; ultra wideband radio channel; wideband channel model; working machine cabin environment; Antenna measurements; Antennas; Delay; Driver circuits; Engines; Frequency measurement; Wireless communication;
Conference_Titel :
Vehicular Technology Conference (VTC Spring), 2011 IEEE 73rd
Conference_Location :
Yokohama
Print_ISBN :
978-1-4244-8332-7
DOI :
10.1109/VETECS.2011.5956346