Theoretical study of guided-mode resonances in planar doubly-periodic dielectric structures

Author

Sydorchuk, N.

Author_Institution

Dept. of Theoretic Radiophys., Inst. of Radio Astron. NASU, Kharkov

fYear

2008

fDate

June 29 2008-July 2 2008

Firstpage

538

Lastpage

540

Abstract

In this paper the scattering characteristics are calculated with the technique based on the volume integral equations for polarization currents. Full-wave analysis is performed. A silicon-on-sapphire periodic structure is used to study the guided-mode resonances in plane-wave excitation conditions. Numerical computations for the reflection spectral resonances are presented for both weak and strong layer modulations. Spectral stability of resonances as a function of angle of incidence is investigated.

Keywords

dielectric devices; electromagnetic wave polarisation; electromagnetic wave scattering; integral equations; periodic structures; angle of incidence; full-wave analysis; guided-mode resonances; planar doubly-periodic dielectric structures; plane-wave excitation; polarization currents; reflection spectral resonances; scattering characteristics; silicon-on-sapphire periodic structure; spectral stability; strong layer modulations; volume integral equations; Brillouin scattering; Dielectrics; Diffraction; Electromagnetic fields; Electromagnetic scattering; Integral equations; Particle scattering; Polarization; Resonance; Slabs;

fLanguage

English

Publisher

ieee

Conference_Titel

Mathematical Methods in Electromagnetic Theory, 2008. MMET 2008. 12th International Conference on

Conference_Location

Odesa

Print_ISBN

978-1-4244-2284-5

Type

conf

DOI

10.1109/MMET.2008.4581056

Filename

4581056