Title :
An MPCN-Based BCH Codec Architecture With Arbitrary Error Correcting Capability
Author :
Chi-Heng Yang ; Yi-Min Lin ; Hsie-Chia Chang ; Chen-Yi Lee
Author_Institution :
Dept. of Electron. EngineeringInstitute of Electron., Nat. Chiao Tung Univ., Hsinchu, Taiwan
Abstract :
This paper presents an area-efficient architecture of arbitrary error correction Bose-Chaudhuri-Hocquenghem codec for NAND flash memory. By factorizing the generator polynomial into several minimal polynomials and utilizing linear feedback shift registers based on minimal polynomials, our reconfigurable design cannot only support multiple error correcting capabilities at a few extra cost, but also merge the encoder and syndrome calculator for efficiently reducing hardware complexity. After being implemented in CMOS 65-nm technology, the test chip supporting t = 1-24 bits can achieve 1.33-Gb/s measured throughput with 73k gate-count while another design supporting t = 60-84 bits can provide 1.60-Gb/s synthesized throughput with 168.6k gate-count.
Keywords :
BCH codes; CMOS digital integrated circuits; codecs; error correction codes; flash memories; shift registers; Bose-Chaudhuri-Hocquenghem codec; CMOS technology; MPCN-based BCH codec architecture; NAND flash memory; arbitrary error correcting capability; area-efficient architecture; bit rate 1.33 Gbit/s; bit rate 1.60 Gbit/s; encoder; gate-count; generator polynomial; linear feedback shift registers; reconfigurable design; size 65 nm; syndrome calculator; word length 1 bit to 24 bit; word length 60 bit to 84 bit; Ash; Codecs; Complexity theory; Computer architecture; Generators; Hardware; Polynomials; Bose–Chaudhuri–Hocquenghem (BCH) codes; Bose???Chaudhuri???Hocquenghem (BCH) codes; NAND flash; encoder; error correcting codes (ECC); syndrome;
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
DOI :
10.1109/TVLSI.2014.2338309