• DocumentCode
    2331271
  • Title

    A hybrid scheme for compacting test responses with unknown values

  • Author

    Chao, Mango C T ; Cheng, Kwang-Ting ; Wang, Seongmoon ; Chakradhar, Srimat T. ; Wei, Wen-Long

  • Author_Institution
    Nat. Chiao Tung Univ., Hsinchu
  • fYear
    2007
  • fDate
    4-8 Nov. 2007
  • Firstpage
    513
  • Lastpage
    519
  • Abstract
    This paper presents a hybrid compaction scheme for test responses containing unknown values, which consists of a space compactor and an unknown-blocking multiple input signature registers (MISR). The proposed scheme guarantees no coverage loss for the modeled faults. The proposed hybrid scheme can also be tuned to observe any user-specified percentage of responses for controlling the coverage loss for un-modeled faults. The experimental results demonstrate that, in comparison with a space compactor or an unknown-blocking MISR alone, the hybrid compaction scheme achieves a lower coverage loss without demanding more test-data volume. In addition, we propose a quantitative approach to estimate the required percentage of observable responses for the proposed scheme, directly based on a test-quality metric of un-modeled faults.
  • Keywords
    automatic test pattern generation; circuit testing; fault diagnosis; logic testing; shift registers; coverage loss; fault model; space compactor; test quality metric; test response compaction; unknown-blocking multiple input signature registers; Automatic test pattern generation; Chaos; Circuit faults; Compaction; Fault detection; Logic; National electric code; Observability; Signal generators; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer-Aided Design, 2007. ICCAD 2007. IEEE/ACM International Conference on
  • Conference_Location
    San Jose, CA
  • ISSN
    1092-3152
  • Print_ISBN
    978-1-4244-1381-2
  • Electronic_ISBN
    1092-3152
  • Type

    conf

  • DOI
    10.1109/ICCAD.2007.4397316
  • Filename
    4397316