DocumentCode :
2331275
Title :
Multi-User Joint Tx/Iterative Rx MMSE-FDE and Successive MUI Cancellation for Uplink DS-CDMA
Author :
Takeda, Kazuki ; Adachi, Fumiyuki
Author_Institution :
Dept. of Electr. & Commun. Eng., Tohoku Univ., Sendai, Japan
fYear :
2011
fDate :
15-18 May 2011
Firstpage :
1
Lastpage :
5
Abstract :
Uplink multi-user direct sequence-code division multi-access (DS-CDMA) suffers from strong multi-user interference (MUI) and self inter-chip interference (ICI) caused by severe frequency-selective fading. In this paper, we propose a joint Tx/iterative Rx frequency-domain equalization (FDE) based on minimum mean square error (MMSE) criterion and successive MUI cancellation (MUIC) for DS-CDMA uplink. In the proposed scheme, each user applies one-tap Tx FDE before transmitting signal. At the base station, joint one-tap Rx FDE and successive MUIC is iteratively performed. The FDE weights of users and base station are jointly optimized based on the MMSE criterion in order to reduce MUI and ICI while exploiting channel frequency-selectivity. Computer simulation results show that the proposed scheme provides much improved bit error rate (BER) performance than the conventional iterative Rx MMSE-FDE with successive MUIC.
Keywords :
code division multiple access; error statistics; fading channels; interference suppression; iterative methods; least mean squares methods; radio receivers; radio transmitters; spread spectrum communication; BER; FDE weights; base station; bit error rate; channel frequency-selectivity; frequency-domain equalization; frequency-selective fading; minimum mean square error criterion; multiuser interference; multiuser joint Tx-iterative Rx MMSE-FDE; self interchip interference; successive MUI cancellation; uplink DS-CDMA; uplink multiuser direct sequence-code division multi-access; Base stations; Bit error rate; Frequency domain analysis; Interference; Joints; Multiaccess communication; Transmitters;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vehicular Technology Conference (VTC Spring), 2011 IEEE 73rd
Conference_Location :
Yokohama
ISSN :
1550-2252
Print_ISBN :
978-1-4244-8332-7
Type :
conf
DOI :
10.1109/VETECS.2011.5956384
Filename :
5956384
Link To Document :
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