DocumentCode
2331374
Title
On the configuration of degradable VLSI/WSI arrays
Author
Low, C.P. ; Leong, H.W.
Author_Institution
Dept. of Inf. Syst. & Comput. Sci., Nat. Univ. of Singapore, Singapore
fYear
1993
fDate
27-29 Oct 1993
Firstpage
64
Lastpage
71
Abstract
The authors consider the problem of reconfiguring VLSI/WSI arrays via the degradation approach. In this approach, all elements are treated uniformly and no elements are dedicated as spares. The goal is to derive a fault-free subarray T from the defective host array such that the dimensions of T are larger than some specified minimum. This problem has been shown to be NP-complete under various switching and routing constraints. However, it is shown that a special case of the reconfiguration problem with row bypass and column rerouting capabilities, is solvable in polynomial time using network flows. Using this result, a new fast and efficient reconfiguration algorithm is proposed. Empirical study shows that the new algorithm indeed produces good results in terms of the percentages of harvest and degradation of VLSI/WSI arrays
Keywords
VLSI; NP completeness; column rerouting; defective host array; degradable VLSI/WSI arrays; degradation; fault-free subarray; harvest; polynomial time; reconfiguration algorithm; routing constraints; row bypass; switching constraints; Computer science; Degradation; Design automation; Information systems; Laboratories; Logic arrays; Polynomials; Routing; Switches; Turning;
fLanguage
English
Publisher
ieee
Conference_Titel
Defect and Fault Tolerance in VLSI Systems, 1993., The IEEE International Workshop on
Conference_Location
Venice
ISSN
1550-5774
Print_ISBN
0-8186-3502-9
Type
conf
DOI
10.1109/DFTVS.1993.595639
Filename
595639
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