Title :
Study on the key technology of integrated analog chip test and system design
Author :
Jingmeng, Liu ; Min, Liao ; Weihai, Chen ; Dong, Xu
Author_Institution :
Sch. of Autom., Beijing Univ. of Aeronaut. & Astronaut., Beijing, China
Abstract :
An integrated analog chip tester has been designed. Since we need to test the analog voltage of analog devices, a kernel architecture based on single chip computer (MCU) and AD converter has been designed. In order to solve the possible blight to tester caused by the damaged chips. This paper presents a technology for isolating inside and outside bus, a technology for double power supplies and a technology for power supply protection. The whole design idea of the tester is introduced in detail. AD converter circuit, DA converter circuit, op amp testing circuit, CW3524 testing circuit and LCD interface circuit have been designed. The procedure of software design is presented, and the primary software modules are explained in detail. Experiment showpiece has been developed. The results of experiments verify the correctness of the design.
Keywords :
analogue-digital conversion; circuit analysis computing; integrated circuit design; integrated circuit testing; AD converter; DA converter circuit; LCD interface circuit; circuit testing; integrated analog chip test; opamp testing circuit; power supply protection; single chip computer; software design; system design; Analog computers; Circuit testing; Computer architecture; Isolation technology; Kernel; Operational amplifiers; Power supplies; Protection; System testing; Voltage; AD converter; LCD; bus; integrated analog chip; self-recovery fuse;
Conference_Titel :
Industrial Electronics and Applications, 2009. ICIEA 2009. 4th IEEE Conference on
Conference_Location :
Xi´an
Print_ISBN :
978-1-4244-2799-4
Electronic_ISBN :
978-1-4244-2800-7
DOI :
10.1109/ICIEA.2009.5138254
