Electrical stability of PLEDs

Author

Kar, Yap Boon ; Bradley, Donal

Author_Institution

Electron. & Commun. Eng. Dept, Univ. Tenaga Nasional, Kajang, Malaysia

fYear

2010

fDate

1-3 Dec. 2010

Firstpage

1

Lastpage

2

Abstract

We report the impact of inserting a 10 nm thickness interlayer between the poly(3,4ethylenedioxythiophene):poly(styrenesulphonate) (PEDOT:PSS) and light-emitting layers on degradation, in particular the electrical stability of the injecting electrodes, in encapsulated polymer light emitting diodes (PLEDs). Continuous electrical stress testing is carried out to study the time evolution of dark injection hole transients for devices with and without a poly [2,7-(9,9di-n-octylfluorene)-alt-(l,4-phenylene-((4-secbutylphenyl)imino)-l,4-phenylene)] (TFB) interlayer. A Sumitomo Chemical Company dibenzothiophene phenylenediamine copolymer (SC002) was used as light emitting layer and PLED characteristics with and without the interlayer are discussed together with lifetime data.

Keywords

association; conducting polymers; electrodes; electroluminescence; encapsulation; light emitting diodes; polymer blends; PEDOT:PSS; PLED; Sumitomo Chemical Company; dark injection hole transients; dibenzothiophene phenylenediamine copolymer; electrical stability; electrical stress testing; electrode injection; encapsulated polymer light emitting diodes; insertion impact; light-emitting layers; poly [2,7-(9,9di-n-octylfluorene)-alt-(l,4-phenylene-((4-secbutylphenyl)imino)-l,4-phenylene)] interlayer; poly(3,4ethylenedioxythiophene); poly(styrenesulphonate); size 10 nm; time evolution;

fLanguage

English

Publisher

ieee

Conference_Titel

Enabling Science and Nanotechnology (ESciNano), 2010 International Conference on

Conference_Location

Kuala Lumpur

Print_ISBN

978-1-4244-8853-7

Type

conf

DOI

10.1109/ESCINANO.2010.5700945

Filename

5700945