Title :
Electrical stability of PLEDs
Author :
Kar, Yap Boon ; Bradley, Donal
Author_Institution :
Electron. & Commun. Eng. Dept, Univ. Tenaga Nasional, Kajang, Malaysia
Abstract :
We report the impact of inserting a 10 nm thickness interlayer between the poly(3,4ethylenedioxythiophene):poly(styrenesulphonate) (PEDOT:PSS) and light-emitting layers on degradation, in particular the electrical stability of the injecting electrodes, in encapsulated polymer light emitting diodes (PLEDs). Continuous electrical stress testing is carried out to study the time evolution of dark injection hole transients for devices with and without a poly [2,7-(9,9di-n-octylfluorene)-alt-(l,4-phenylene-((4-secbutylphenyl)imino)-l,4-phenylene)] (TFB) interlayer. A Sumitomo Chemical Company dibenzothiophene phenylenediamine copolymer (SC002) was used as light emitting layer and PLED characteristics with and without the interlayer are discussed together with lifetime data.
Keywords :
association; conducting polymers; electrodes; electroluminescence; encapsulation; light emitting diodes; polymer blends; PEDOT:PSS; PLED; Sumitomo Chemical Company; dark injection hole transients; dibenzothiophene phenylenediamine copolymer; electrical stability; electrical stress testing; electrode injection; encapsulated polymer light emitting diodes; insertion impact; light-emitting layers; poly [2,7-(9,9di-n-octylfluorene)-alt-(l,4-phenylene-((4-secbutylphenyl)imino)-l,4-phenylene)] interlayer; poly(3,4ethylenedioxythiophene); poly(styrenesulphonate); size 10 nm; time evolution;
Conference_Titel :
Enabling Science and Nanotechnology (ESciNano), 2010 International Conference on
Conference_Location :
Kuala Lumpur
Print_ISBN :
978-1-4244-8853-7
DOI :
10.1109/ESCINANO.2010.5700945
