DocumentCode :
2331705
Title :
A novel line detection method using magnetic sensor for the optical inspection of electrical short defects on TFT LCD
Author :
Hwang, Il-Han ; Yang, Hee-Gu ; Choi, Sang-Su ; Lee, Seong-Yeol ; Jeong, Chang-Wook ; Jeong, Dae-Hwa
Author_Institution :
Productivity Res. Inst. (PRI), LG Electron., Pyungtaek, South Korea
fYear :
2009
fDate :
21-23 Sept. 2009
Firstpage :
215
Lastpage :
218
Abstract :
A novel detection method is suggested using magnetic sensor to detect the short-defect line on LCD-TFT panel. With the voltage applied to the TFT panel, current flows along the short-defect line generating magnetic field around it. By scanning the magnetic sensor across the TFT panel, the defect line can be detected. Vision inspection is performed along the detected line to find out the defect point. Three main types of short-defects on TFT panel are tested and their locations are successfully detected by the suggested method.
Keywords :
automatic optical inspection; liquid crystal displays; magnetic fields; magnetic sensors; thin film transistors; LCD-TFT panel; electrical short defects; line detection; magnetic field; magnetic sensor; optical inspection; short defect line; thin films transistors; vision inspection; Electrical resistance measurement; Inspection; Liquid crystal displays; MOSFET circuits; Magnetic field measurement; Magnetic fields; Magnetic sensors; Optical sensors; Thin film transistors; Voltage; LCD; TFT; magnetic field; non-contact; short;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Optomechatronic Technologies, 2009. ISOT 2009. International Symposium on
Conference_Location :
Istanbul
Print_ISBN :
978-1-4244-4209-6
Electronic_ISBN :
978-1-4244-4210-2
Type :
conf
DOI :
10.1109/ISOT.2009.5326084
Filename :
5326084
Link To Document :
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