DocumentCode
2331747
Title
Development of speckle interferometry algorithm and system
Author
Shamsir, Atika Atira Mohamad ; Jafri, Mohd Zubir Mat ; San, Lim Hwee
Author_Institution
Sch. Of Phys., Univ. Sains Malaysia, Minden, Malaysia
fYear
2010
fDate
1-3 Dec. 2010
Firstpage
1
Lastpage
1
Abstract
This paper discusses about Electronic speckle pattern interferometry. It is a wholefield, non destructive measurement method widely used in the industries such as detection of defects on metal bodies.
Keywords
electronic speckle pattern interferometry; ESPI method; defect detection; electronic speckle pattern interferometry method; nondestructive measurement method; speckle interferometry algorithm;
fLanguage
English
Publisher
ieee
Conference_Titel
Enabling Science and Nanotechnology (ESciNano), 2010 International Conference on
Conference_Location
Kuala Lumpur
Print_ISBN
978-1-4244-8853-7
Type
conf
DOI
10.1109/ESCINANO.2010.5700951
Filename
5700951
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