DocumentCode :
2331810
Title :
Fault localization based on loop status monitoring
Author :
Xia, Chunming G. ; Howell, John
Author_Institution :
Dept. of Mech. Eng., Glasgow Univ., UK
Volume :
2
fYear :
2002
fDate :
2002
Firstpage :
844
Abstract :
A problem loop in a process plant containing a number of interacting PI or PID control loops is identified by comparing the overall loop performance indices associated with each of the loops involved. These indices are derived from a number of loop performance statistics that include the qualitative loop status, which can be one of seven categories. The derivation of the index is described and its performance is tested on various data sets. The background is given in a companion paper.
Keywords :
chemical technology; closed loop systems; control system analysis; fault location; performance index; process control; process monitoring; three-term control; two-term control; Eastman Chemical Company plant; closed loop assessment; fault localization; interacting PI control loops; interacting PID control loops; loop performance indices; loop performance statistics; loop status monitoring; process control; qualitative loop status; Degradation; Frequency; Identity-based encryption; Mechanical engineering; Monitoring; Statistics; Steady-state; Testing; Three-term control; Wavelet packets;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Control Applications, 2002. Proceedings of the 2002 International Conference on
Print_ISBN :
0-7803-7386-3
Type :
conf
DOI :
10.1109/CCA.2002.1038712
Filename :
1038712
Link To Document :
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