Title :
Discrete event simulation in a semiconductor assembly area
Author :
Chang, Y.S. ; Choe, S.H. ; Besant, C.B.
Author_Institution :
Imperial Coll. of Sci., Technol. & Med., London, UK
Abstract :
This paper discusses a simulation experience in semiconductor assembly manufacturing areas. Much research on semiconductor wafer fabrication and final test areas has been active, however, not much research has been done in a semiconductor assembly area. Because of its characteristics of mass production and the stochastic nature of simulation, practical application of simulation to the semiconductor assembly area has many problems. In this paper we present an analysis of manufacturing performances in a specific semiconductor assembly area
Keywords :
discrete event simulation; discrete event simulation; mass production; semiconductor assembly area;
Conference_Titel :
Factory 2000 - The Technology Exploitation Process, Fifth International Conference on (Conf. Publ. No. 435)
Conference_Location :
Cambridge
Print_ISBN :
0-85296-682-2
DOI :
10.1049/cp:19970142
