• DocumentCode
    2332080
  • Title

    Discrete event simulation in a semiconductor assembly area

  • Author

    Chang, Y.S. ; Choe, S.H. ; Besant, C.B.

  • Author_Institution
    Imperial Coll. of Sci., Technol. & Med., London, UK
  • fYear
    1997
  • fDate
    2-4 Apr 1997
  • Firstpage
    183
  • Lastpage
    188
  • Abstract
    This paper discusses a simulation experience in semiconductor assembly manufacturing areas. Much research on semiconductor wafer fabrication and final test areas has been active, however, not much research has been done in a semiconductor assembly area. Because of its characteristics of mass production and the stochastic nature of simulation, practical application of simulation to the semiconductor assembly area has many problems. In this paper we present an analysis of manufacturing performances in a specific semiconductor assembly area
  • Keywords
    discrete event simulation; discrete event simulation; mass production; semiconductor assembly area;
  • fLanguage
    English
  • Publisher
    iet
  • Conference_Titel
    Factory 2000 - The Technology Exploitation Process, Fifth International Conference on (Conf. Publ. No. 435)
  • Conference_Location
    Cambridge
  • ISSN
    0537-9989
  • Print_ISBN
    0-85296-682-2
  • Type

    conf

  • DOI
    10.1049/cp:19970142
  • Filename
    608063