DocumentCode :
2332149
Title :
Attaining process capability using multiple linear regression and other techniques
Author :
Biss, T.H.
Author_Institution :
Plymouth Univ., UK
fYear :
1997
fDate :
2-4 Apr 1997
Firstpage :
202
Lastpage :
206
Abstract :
This paper describes the development and refinement of a series of models, based around simultaneous multiple linear regression models, to predict the layer thickness resulting from a manufacturing process. The process is the makin of optical films by the depsition of very thin layers of titanium dioxide and silicone dioxide. As the model enable the company (Omitec Thin Films Ltd. of Plympton) to improve its prediction of layer thickness, so it is able to improve process capability, reduce scrap, and improve its record of short lead time, on-time delivery of conforming products
Keywords :
optical films; Omitec Thin Films Ltd.; SiO2; TiO2; layer thickness; optical film deposition; process capability; scrap reduction; short lead-time on-time delivery; silicone dioxide; simultaneous multiple linear regression models; thin layer deposition; titanium dioxide;
fLanguage :
English
Publisher :
iet
Conference_Titel :
Factory 2000 - The Technology Exploitation Process, Fifth International Conference on (Conf. Publ. No. 435)
Conference_Location :
Cambridge
ISSN :
0537-9989
Print_ISBN :
0-85296-682-2
Type :
conf
DOI :
10.1049/cp:19970145
Filename :
608066
Link To Document :
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