DocumentCode :
2332159
Title :
Sizing and placement of charge recycling transistors in MTCMOS circuits
Author :
Pakbaznia, Ehsan ; Pedram, Massoud ; Fallah, Farzan
Author_Institution :
Southern California Univ., Los Angeles
fYear :
2007
fDate :
4-8 Nov. 2007
Firstpage :
791
Lastpage :
796
Abstract :
A downside of using Multi-Threshold CMOS (MTCMOS) technique for leakage reduction is the energy consumption during transitions between sleep and active modes. Previously, a charge recycling (CR) MTCMOS architecture was proposed to reduce the large amount of energy consumption that occurs during the mode transitions in power-gated circuits. Considering the RC parasitics of the virtual ground and VDD lines, proper sizing and placement of charge-recycling transistors is key to achieving the maximum power saving. In this paper, we show that the sizing and placement problems of charge-recycling transistors in CR-MTCMOS can be formulated as a linear programming problem, and hence, can be efficiently solved using standard mathematical programming packages. The proposed sizing and placement techniques allow us to employ the CR-MTCMOS solution in large row-based standard cell layouts while achieving nearly the full potential of this power-gating architecture, i.e., we achieve 44% saving in switching energy due to the mode transition in CR-MTCMOS compared to standard MTCMOS.
Keywords :
CMOS integrated circuits; MOSFET; integrated circuit layout; integrated circuit packaging; linear programming; recycling; MTCMOS circuits; charge recycling transistor; leakage reduction; linear programming problem; multithreshold; placement techniques; power-gating architecture; row-based standard cell layout; sizing techniques; standard mathematical programming package; CMOS logic circuits; CMOS technology; Chromium; Delay; Energy consumption; Linear programming; Logic devices; Mathematical programming; Recycling; Threshold voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer-Aided Design, 2007. ICCAD 2007. IEEE/ACM International Conference on
Conference_Location :
San Jose, CA
ISSN :
1092-3152
Print_ISBN :
978-1-4244-1381-2
Electronic_ISBN :
1092-3152
Type :
conf
DOI :
10.1109/ICCAD.2007.4397362
Filename :
4397362
Link To Document :
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