• DocumentCode
    2332423
  • Title

    Beyond Triangle Inequality: Sifting Noisy and Outlier Distance Measurements for Localization

  • Author

    Jian, Lirong ; Yang, Zheng ; Yunhao Liu

  • Author_Institution
    Hong Kong Univ. of Sci. & Technol., Hong Kong, China
  • fYear
    2010
  • fDate
    14-19 March 2010
  • Firstpage
    1
  • Lastpage
    9
  • Abstract
    Knowing accurate positions of nodes in wireless ad-hoc and sensor networks is essential for a wide range of pervasive and mobile applications. However, errors are inevitable in distance measurements and we observe that a small number of outliers can degrade localization accuracy drastically. To deal with noisy and outlier ranging results, triangle inequality is often employed in existing approaches. Our study shows that triangle inequality has a lot of limitations which make it far from accurate and reliable. In this study, we formally define the outlier detection problem for network localization and build a theoretical foundation to identify outliers based on graph embeddability and rigidity theory. Our analysis shows that the redundancy of distance measurements plays an important role. We then design a bilateration generic cycles based outlier detection algorithm, and examine its effectiveness and efficiency through a network prototype implementation of MicaZ motes as well as extensive simulations. The results shows that our design significantly improves the localization accuracy by wisely rejecting outliers.
  • Keywords
    ad hoc networks; graph theory; wireless sensor networks; MicaZ motes; bilateration generic cycles; graph embeddability theory; graph rigidity theory; localization accuracy; network localization; outlier detection; outlier distance measurements; triangle inequality; wireless ad-hoc networks; wireless sensor networks; Calibration; Communications Society; Distance measurement; Hardware; Mobile computing; Peer to peer computing; Receiving antennas; Space technology; Transmitters; Wireless sensor networks;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    INFOCOM, 2010 Proceedings IEEE
  • Conference_Location
    San Diego, CA
  • ISSN
    0743-166X
  • Print_ISBN
    978-1-4244-5836-3
  • Type

    conf

  • DOI
    10.1109/INFCOM.2010.5462019
  • Filename
    5462019