DocumentCode :
2332423
Title :
Beyond Triangle Inequality: Sifting Noisy and Outlier Distance Measurements for Localization
Author :
Jian, Lirong ; Yang, Zheng ; Yunhao Liu
Author_Institution :
Hong Kong Univ. of Sci. & Technol., Hong Kong, China
fYear :
2010
fDate :
14-19 March 2010
Firstpage :
1
Lastpage :
9
Abstract :
Knowing accurate positions of nodes in wireless ad-hoc and sensor networks is essential for a wide range of pervasive and mobile applications. However, errors are inevitable in distance measurements and we observe that a small number of outliers can degrade localization accuracy drastically. To deal with noisy and outlier ranging results, triangle inequality is often employed in existing approaches. Our study shows that triangle inequality has a lot of limitations which make it far from accurate and reliable. In this study, we formally define the outlier detection problem for network localization and build a theoretical foundation to identify outliers based on graph embeddability and rigidity theory. Our analysis shows that the redundancy of distance measurements plays an important role. We then design a bilateration generic cycles based outlier detection algorithm, and examine its effectiveness and efficiency through a network prototype implementation of MicaZ motes as well as extensive simulations. The results shows that our design significantly improves the localization accuracy by wisely rejecting outliers.
Keywords :
ad hoc networks; graph theory; wireless sensor networks; MicaZ motes; bilateration generic cycles; graph embeddability theory; graph rigidity theory; localization accuracy; network localization; outlier detection; outlier distance measurements; triangle inequality; wireless ad-hoc networks; wireless sensor networks; Calibration; Communications Society; Distance measurement; Hardware; Mobile computing; Peer to peer computing; Receiving antennas; Space technology; Transmitters; Wireless sensor networks;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
INFOCOM, 2010 Proceedings IEEE
Conference_Location :
San Diego, CA
ISSN :
0743-166X
Print_ISBN :
978-1-4244-5836-3
Type :
conf
DOI :
10.1109/INFCOM.2010.5462019
Filename :
5462019
Link To Document :
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