DocumentCode
2332428
Title
Fault interaction and its repercussions
Author
DiGiuseppe, Nicholas ; Jones, James A.
Author_Institution
Dept. of Inf., Univ. of California, Irvine, CA, USA
fYear
2011
fDate
25-30 Sept. 2011
Firstpage
3
Lastpage
12
Abstract
Multiple faults in a program can interact to form new behaviors in a program that would not be realized if the program were to contain the individual faults. This paper presents an in-depth study of the effects of the interaction of faults within a program. Many researchers attempt to ameliorate the effects of faulty programs. Unfortunately, such researchers are left to rely upon intuition about fault behavior due to the paucity of formalized studies of faults and their behavior. In an attempt to advance the understanding of faults and their behavior, we conducted a study of fault interaction across six subjects with more than 65,000 multiple-fault versions. The results of our study show four significant types of interaction, with one type - faults obscuring the effects of other faults - as the most prevalent type. The prevalence of obscuring faults´ effects has an adverse effect on many automated software-engineering techniques, such as regression-testing, fault-localization, and fault-clustering techniques. Given that software commonly contains more than a single fault, these results have implications for developers and researchers alike by informing them of expected complications, which in many instances are opposite to intuition.
Keywords
fault diagnosis; program testing; regression analysis; software engineering; software fault tolerance; automated software-engineering techniques; fault behavior; fault interaction; fault-clustering techniques; fault-localization; faulty programs; formalized studies; multiple-fault versions; obscuring faults effects; program faults; regression-testing; repercussions; Flexible printed circuits; Informatics; Interference; Noise; Schedules; Software; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Software Maintenance (ICSM), 2011 27th IEEE International Conference on
Conference_Location
Williamsburg, VI
ISSN
1063-6773
Print_ISBN
978-1-4577-0663-9
Electronic_ISBN
1063-6773
Type
conf
DOI
10.1109/ICSM.2011.6080767
Filename
6080767
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