Title :
Functional testing and reconfiguration of MIMD machines
Author :
Aktouf, Ch ; Robach, Ch ; Mazaré, G. ; Johansson, J.
Author_Institution :
LGI/IMAG, Grenoble, France
Abstract :
The authors present a strategy for testing MIMD parallel machines. First they detail a functional testing methodology. Based on a functional fault model for the communications between processors, the authors propose a distributed diagnosis strategy and the test program generation process. Next, a fault-tolerant routing algorithm is proposed. Taking into account the results obtained from the testing phase, this algorithm allows successful routing of messages between fault-free cells
Keywords :
parallel architectures; MIMD machines; distributed diagnosis strategy; fault-free cells; fault-tolerant routing algorithm; functional fault model; parallel machines; reconfiguration; test program generation; Circuit faults; Circuit testing; Fault diagnosis; Fault tolerance; Microelectronics; Multiprocessing systems; Parallel architectures; Parallel machines; Routing; System testing;
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 1993., The IEEE International Workshop on
Conference_Location :
Venice
Print_ISBN :
0-8186-3502-9
DOI :
10.1109/DFTVS.1993.595645
