• DocumentCode
    2332464
  • Title

    Numerical simulation of transport properties in InAs/Si heterojunction nanowire tunneling field effect transistors

  • Author

    Miyoshi, Y. ; Ogawa, M. ; Souma, S. ; Nakamura, H.

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Kobe Univ., Kobe, Japan
  • fYear
    2012
  • fDate
    9-11 May 2012
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    Electronic transport in InAs/Si heterojunction nanowire (NW) band-to-band tunneling field-effect transistors (TFETs) is studied numerically using the non-equilibrium Green´s function formalism based on the sp3s*d5 tight-binding Hamiltonian. Our analyses have shown that TFETs based on the InAs/Si heterojunction NW have superior properties compared with those based on the Si and InAs homojunction NWs in obtaining the higher on-current, lower leakage current as well as the steeper subthreshold swing. The physical origin behind such superiority can be successfully understood by analyzing the complex band structures and the local densities of states.
  • Keywords
    Green´s function methods; band structure; elemental semiconductors; field effect transistors; indium compounds; leakage currents; nanowires; silicon; tunnelling; InAs-Si; TFET; band-to-band tunneling; complex band structure; eectronic transport; heterojunction nanowire; leakage current; nonequilibrium Green´s function formalism; sp3s*d5 tight-binding Hamiltonian; subthreshold swing; tunneling field effect transistor; Green´s function methods; Heterojunctions; Leakage current; Logic gates; MOSFETs; Silicon; Tunneling; TFETs; heterojunction; nanowire; non-equilibrium Green´s function method; tight-binding method;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Future of Electron Devices, Kansai (IMFEDK), 2012 IEEE International Meeting for
  • Conference_Location
    Osaka
  • Print_ISBN
    978-1-4673-0837-3
  • Type

    conf

  • DOI
    10.1109/IMFEDK.2012.6218605
  • Filename
    6218605