Title :
Numerical simulation of transport properties in InAs/Si heterojunction nanowire tunneling field effect transistors
Author :
Miyoshi, Y. ; Ogawa, M. ; Souma, S. ; Nakamura, H.
Author_Institution :
Dept. of Electr. & Electron. Eng., Kobe Univ., Kobe, Japan
Abstract :
Electronic transport in InAs/Si heterojunction nanowire (NW) band-to-band tunneling field-effect transistors (TFETs) is studied numerically using the non-equilibrium Green´s function formalism based on the sp3s*d5 tight-binding Hamiltonian. Our analyses have shown that TFETs based on the InAs/Si heterojunction NW have superior properties compared with those based on the Si and InAs homojunction NWs in obtaining the higher on-current, lower leakage current as well as the steeper subthreshold swing. The physical origin behind such superiority can be successfully understood by analyzing the complex band structures and the local densities of states.
Keywords :
Green´s function methods; band structure; elemental semiconductors; field effect transistors; indium compounds; leakage currents; nanowires; silicon; tunnelling; InAs-Si; TFET; band-to-band tunneling; complex band structure; eectronic transport; heterojunction nanowire; leakage current; nonequilibrium Green´s function formalism; sp3s*d5 tight-binding Hamiltonian; subthreshold swing; tunneling field effect transistor; Green´s function methods; Heterojunctions; Leakage current; Logic gates; MOSFETs; Silicon; Tunneling; TFETs; heterojunction; nanowire; non-equilibrium Green´s function method; tight-binding method;
Conference_Titel :
Future of Electron Devices, Kansai (IMFEDK), 2012 IEEE International Meeting for
Conference_Location :
Osaka
Print_ISBN :
978-1-4673-0837-3
DOI :
10.1109/IMFEDK.2012.6218605