• DocumentCode
    2332557
  • Title

    Fabrication of an ordered anodic aluminum oxide pore arrays with an interpore distance smaller than the nano-indentation pitch formed by ion beam etching

  • Author

    Wang, Chonge ; Ishida, Yasuharu ; Saitoh, Ken-ichi ; Shimizu, Tomohiro ; Shingubara, Shoso ; Tanaka, Shukichi

  • Author_Institution
    Grad. Sch. of Sci. & Technol., Kansai Univ., Suita, Japan
  • fYear
    2012
  • fDate
    9-11 May 2012
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    We investigated a method for preparation of self-ordering nanopore arrays with the interpore distance of 60 nm by guided self-organization of anodic aluminum oxide (AAO) with a pre-patterned ordered array of indentations of Al film. An ordered triangular array of 100 nm-pitch indentations was formed on Al film by ion beam etching (IBE) with the EB resist mask, and then it was used as a guide for formation of AAO pore. We found it was possible to reduce an interpore distance of AAO to 1/√3 of the pitch of the indentation by the choice of appropriate IBE parameters and anodization voltage.
  • Keywords
    aluminium compounds; anodisation; etching; ion beam lithography; masks; nanoindentation; photoresists; AlO; EB resist mask; IBE parameters; anodization voltage; distance 60 nm; interpore distance; ion beam etching; nanoindentation pitch; ordered anodic aluminum oxide pore array fabrication; ordered triangular array; self-ordering nanopore arrays; Etching; Films; Scanning electron microscopy; Silicon; Substrates; Surface morphology; Anodic Aluminum Oxide (AAO); electron beam (EB) lithography; ion beam etching (IBE); pre-patterned;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Future of Electron Devices, Kansai (IMFEDK), 2012 IEEE International Meeting for
  • Conference_Location
    Osaka
  • Print_ISBN
    978-1-4673-0837-3
  • Type

    conf

  • DOI
    10.1109/IMFEDK.2012.6218612
  • Filename
    6218612