DocumentCode :
2332557
Title :
Fabrication of an ordered anodic aluminum oxide pore arrays with an interpore distance smaller than the nano-indentation pitch formed by ion beam etching
Author :
Wang, Chonge ; Ishida, Yasuharu ; Saitoh, Ken-ichi ; Shimizu, Tomohiro ; Shingubara, Shoso ; Tanaka, Shukichi
Author_Institution :
Grad. Sch. of Sci. & Technol., Kansai Univ., Suita, Japan
fYear :
2012
fDate :
9-11 May 2012
Firstpage :
1
Lastpage :
2
Abstract :
We investigated a method for preparation of self-ordering nanopore arrays with the interpore distance of 60 nm by guided self-organization of anodic aluminum oxide (AAO) with a pre-patterned ordered array of indentations of Al film. An ordered triangular array of 100 nm-pitch indentations was formed on Al film by ion beam etching (IBE) with the EB resist mask, and then it was used as a guide for formation of AAO pore. We found it was possible to reduce an interpore distance of AAO to 1/√3 of the pitch of the indentation by the choice of appropriate IBE parameters and anodization voltage.
Keywords :
aluminium compounds; anodisation; etching; ion beam lithography; masks; nanoindentation; photoresists; AlO; EB resist mask; IBE parameters; anodization voltage; distance 60 nm; interpore distance; ion beam etching; nanoindentation pitch; ordered anodic aluminum oxide pore array fabrication; ordered triangular array; self-ordering nanopore arrays; Etching; Films; Scanning electron microscopy; Silicon; Substrates; Surface morphology; Anodic Aluminum Oxide (AAO); electron beam (EB) lithography; ion beam etching (IBE); pre-patterned;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Future of Electron Devices, Kansai (IMFEDK), 2012 IEEE International Meeting for
Conference_Location :
Osaka
Print_ISBN :
978-1-4673-0837-3
Type :
conf
DOI :
10.1109/IMFEDK.2012.6218612
Filename :
6218612
Link To Document :
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