DocumentCode
2332591
Title
Fast soft error rate computing technique based on state probability propagating
Author
Weiguang, Sheng ; Liyi, Xiao ; Zhigang, Mao
Author_Institution
Micro Electron. Center, Harbin Inst. of Technol., Harbin, China
fYear
2009
fDate
25-27 May 2009
Firstpage
734
Lastpage
738
Abstract
Fast soft error sensitivity characterization technique is essential for the soft error tolerance optimization of modern VLSI circuits. In this paper, an efficient soft error evaluation technique based on syntax analysis and state probability propagating technique is developed, which can automatically analyze the soft error rate of combinational logic circuits and the combinational part of sequential circuits in Verilog synthesized netlist within a few seconds. We implemented the idea in a software tool called HSECT-ANLY, which use Verilog syntax analysis to automate the soft error rate evaluation procedure and state propagating technique to speed up the analyzation process. By using HSECT-ANLY, experiments are carried out on some ISCAS´85 and ISCAS´89 benchmark circuits implemented with TSMC 0.18 mum technology and results are obtained. The result comparison with the traditional test vector propagating technique shows that the introduced method is much faster (2-3 magnitudes speeding up) with some accuracy losses, and be very suitable for the reliability optimization as the sub-algorithm of the optimization algorithms such as genetic algorithms to evaluate the fitness (soft error rate) rapidly.
Keywords
VLSI; hardware description languages; logic circuits; optimisation; probability; HSECT-ANLY; VLSI circuits; Verilog; combinational logic circuits; fast soft error rate computing technique; genetic algorithms; sequential circuits; software tool; state probability propagating technique; syntax analysis; Benchmark testing; Circuit synthesis; Circuit testing; Combinational circuits; Error analysis; Hardware design languages; Optimization methods; Sequential circuits; Software tools; Very large scale integration; Soft error; combinational logic circuit; reliability optimization; state probability propagating; syntax analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Industrial Electronics and Applications, 2009. ICIEA 2009. 4th IEEE Conference on
Conference_Location
Xi´an
Print_ISBN
978-1-4244-2799-4
Electronic_ISBN
978-1-4244-2800-7
Type
conf
DOI
10.1109/ICIEA.2009.5138302
Filename
5138302
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