• DocumentCode
    2332591
  • Title

    Fast soft error rate computing technique based on state probability propagating

  • Author

    Weiguang, Sheng ; Liyi, Xiao ; Zhigang, Mao

  • Author_Institution
    Micro Electron. Center, Harbin Inst. of Technol., Harbin, China
  • fYear
    2009
  • fDate
    25-27 May 2009
  • Firstpage
    734
  • Lastpage
    738
  • Abstract
    Fast soft error sensitivity characterization technique is essential for the soft error tolerance optimization of modern VLSI circuits. In this paper, an efficient soft error evaluation technique based on syntax analysis and state probability propagating technique is developed, which can automatically analyze the soft error rate of combinational logic circuits and the combinational part of sequential circuits in Verilog synthesized netlist within a few seconds. We implemented the idea in a software tool called HSECT-ANLY, which use Verilog syntax analysis to automate the soft error rate evaluation procedure and state propagating technique to speed up the analyzation process. By using HSECT-ANLY, experiments are carried out on some ISCAS´85 and ISCAS´89 benchmark circuits implemented with TSMC 0.18 mum technology and results are obtained. The result comparison with the traditional test vector propagating technique shows that the introduced method is much faster (2-3 magnitudes speeding up) with some accuracy losses, and be very suitable for the reliability optimization as the sub-algorithm of the optimization algorithms such as genetic algorithms to evaluate the fitness (soft error rate) rapidly.
  • Keywords
    VLSI; hardware description languages; logic circuits; optimisation; probability; HSECT-ANLY; VLSI circuits; Verilog; combinational logic circuits; fast soft error rate computing technique; genetic algorithms; sequential circuits; software tool; state probability propagating technique; syntax analysis; Benchmark testing; Circuit synthesis; Circuit testing; Combinational circuits; Error analysis; Hardware design languages; Optimization methods; Sequential circuits; Software tools; Very large scale integration; Soft error; combinational logic circuit; reliability optimization; state probability propagating; syntax analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics and Applications, 2009. ICIEA 2009. 4th IEEE Conference on
  • Conference_Location
    Xi´an
  • Print_ISBN
    978-1-4244-2799-4
  • Electronic_ISBN
    978-1-4244-2800-7
  • Type

    conf

  • DOI
    10.1109/ICIEA.2009.5138302
  • Filename
    5138302