DocumentCode :
2332662
Title :
Symbol error rate of selective cooperation in Nakagami-m environments
Author :
Zhang, Jing ; Zhang, Taiyi ; Huang, Jianxiong ; Yuan, Runping
Author_Institution :
Dept. of Inf. Eng., Xi´´an Jiaotong Univ., Xi´´an, China
fYear :
2009
fDate :
25-27 May 2009
Firstpage :
763
Lastpage :
767
Abstract :
In this paper, we present asymptotic symbol error rate (SER) analysis for selective amplify-and-forward (AF) cooperative systems with arbitrary number of relays. Any relay channel involved experiences independent and non-identically distributed Nakagami-m fading. Due to the complicated form of the probability density function (PDF) of the instantaneous dual-hop link signal-to-noise ratio (SNR), we provide its tight approximation at high SNR regions. The result reveals that the dual-hop relay link is dominated by the more severely fading hop and is extendable to multiple-relay scenarios. Further, SER is obtained for selective relaying systems, which is in quite simple and generalized form. It´s indicated that although selection among relays achieves the same diversity gain as the conventional all-participate schemes, it results in significant coding gain improvements. Simulation results verify the tightness of presented analysis at medium to high SNR regions in Nakagami-m environments with arbitrary severity parameter m ges 0.5.
Keywords :
Nakagami channels; channel coding; diversity reception; error statistics; Nakagami-m environment; PDF; SNR; asymptotic symbol error rate; coding gain improvement; cooperative system; diversity gain; instantaneous dual-hop relay link; multiple-relay scenarios; nonidentically distributed channel; probability density function; relay channel; selective amplify-and-forward system; signal-to-noise ratio; tight approximation; Error analysis; Cooperative diversity; Nakagami-m fading; amplify-and-forward; symbol error rate;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial Electronics and Applications, 2009. ICIEA 2009. 4th IEEE Conference on
Conference_Location :
Xi´an
Print_ISBN :
978-1-4244-2799-4
Electronic_ISBN :
978-1-4244-2800-7
Type :
conf
DOI :
10.1109/ICIEA.2009.5138307
Filename :
5138307
Link To Document :
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