Title :
IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) - Cover
Abstract :
The following topics are dealt with: processor architectures; analogue design; RF design; NoC testing; fault tolerance; integrated circuit security; ASIC; FPGA design; fault detection; test generation; online testing; microprocessor reliability; nanoscale technology reliability; and physical design.
Keywords :
analogue circuits; application specific integrated circuits; fault diagnosis; fault tolerance; field programmable gate arrays; integrated circuit design; integrated circuit reliability; integrated circuit testing; logic design; microprocessor chips; nanoelectronics; network-on-chip; ASIC; FPGA design; NoC testing; RF design; analogue design; fault detection; fault tolerance; integrated circuit security; microprocessor reliability; nanoscale technology reliability; online testing; physical design; processor architectures; test generation;
Conference_Titel :
Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2012 IEEE 15th International Symposium on
Conference_Location :
Tallinn
Print_ISBN :
978-1-4673-1187-8
Electronic_ISBN :
978-1-4673-1186-1
DOI :
10.1109/DDECS.2012.6219001
