Design methodology for fault tolerant ASICs

The sensitivity of application specific integrated circuits (ASICs) to the single event effects (SEE) can induce failures of the systems which are exposed to increased radiation levels in the space and on the ground. This paper presents a design methodology for a full fault tolerant ASIC that is immune to the single event upsets (SEU) in sequential logic, the single event transients (SET) in combinational logic and the single event latchup (SEL). The dual modular redundancy (DMR) and a SEL power-switch (SPS) are the basis for a modified ASIC design flow. Measurement results have proven the correct functionality of DMR and SPS circuits, as well as a high fault tolerance of implemented ASICs along with moderate overhead in respect of power consumption and occupied silicon area.