Title :
A defect-tolerant design for WSI interconnection networks and its application to hypercube
Author_Institution :
Dept. of Inf. & Comput. Sci., Ciuba Univ., Japan
Abstract :
A defect-tolerant design for WSI interconnection networks (INs) is proposed, and three schemes with different switch structures are examined. Open defects on wiring lines and short defects between adjacent two wiring lines in links are assumed for defects in INs. The basic idea of the proposed design is to add redundant wiring lines and switches into each physical link. The three schemes are compared by evaluating yields when they are applied to hypercube networks. As a result, one scheme is superior to others, and an effect of defect-tolerant design by the scheme is effective and useful for six and eight dimensional hypercubes
Keywords :
wafer-scale integration; WSI interconnection networks; defect-tolerant design; hypercube; open defects; redundancy; short defects; switch structures; wiring lines; yields; Application software; Computer networks; Electronic mail; Hypercubes; Intelligent networks; Multiprocessor interconnection networks; Parallel processing; Switches; Wafer scale integration; Wiring;
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 1993., The IEEE International Workshop on
Conference_Location :
Venice
Print_ISBN :
0-8186-3502-9
DOI :
10.1109/DFTVS.1993.595652