DocumentCode
2333921
Title
Towards a ´safe´ use of design patterns to improve OO software testability
Author
Baudry, Benoit ; Le Traon, Yves ; Sunyé, Gerson ; Jézéquel, Jean-Marc
Author_Institution
IRISA, Rennes, France
fYear
2001
fDate
27-30 Nov. 2001
Firstpage
324
Lastpage
329
Abstract
Design-for-testability is a very important issue in software engineering. It becomes crucial in the case of OO designs where control flows are generally not hierarchical, but are diffuse and distributed over the whole architecture. We introduce the concept of a "testing conflict" when potentially concurrent client/supplier relationships between the same classes along different paths exist in a system. Such conflicts may be hard to test, especially when dynamic binding and polymorphism are involved. We describe the conflicts using topological class configuration diagrams. An overall architecture is represented as a combination of the initial design and several patterns. We focus on the design patterns as coherent subsets in the architecture, and we explain how their use can provide a way for limiting the complexity of testing for conflicts, and of confining their effects to the classes involved in the pattern.
Keywords
design for testability; object-oriented programming; program testing; software engineering; 00 designs; control flows; design-for-testability; software engineering; Computer architecture; Costs; Life testing; Software architecture; Software design; Software engineering; Software safety; Software testing; System testing; Unified modeling language;
fLanguage
English
Publisher
ieee
Conference_Titel
Software Reliability Engineering, 2001. ISSRE 2001. Proceedings. 12th International Symposium on
ISSN
1071-9458
Print_ISBN
0-7695-1306-9
Type
conf
DOI
10.1109/ISSRE.2001.989486
Filename
989486
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