• DocumentCode
    2334145
  • Title

    Efficient link-level error resilience in 3D NoCs

  • Author

    Pasca, Vladimir ; Rehman, Saif-Ur ; Anghel, Lorena ; Benabdenbi, Mounir

  • Author_Institution
    TIMA Lab., INP-Grenoble, Grenoble, France
  • fYear
    2012
  • fDate
    18-20 April 2012
  • Firstpage
    127
  • Lastpage
    132
  • Abstract
    Due to their scalability and flexibility, Networks-on-Chip are among the most popular communication fabrics for 3D integrated systems. 3D NoCs consist of a mix of inter-die and intra-die links implemented in different technologies. Thus, in order to guarantee correct data transmission through the 3D NoC, link reliability must be ensured. Error resilience techniques have been developed to protect links at the expense of increased area and power consumption, and reduced performance. In this paper, error resilience schemes are implemented for NoC links in stacked 3D integrated systems. We analyze, with respect to area / power overheads and reliability, the impact of inter-die and intra-die link-level error resilience techniques on a 3D NoC router architecture. Our results show that inter-die link protection with correction-based schemes and interleaved single error correction (SEC) codes are more efficient than traditional protection on all links.
  • Keywords
    error correction codes; integrated circuit reliability; interleaved codes; network routing; network-on-chip; 3D NoC router architecture; SEC; area consumption; area overheads; communication fabrics; correction-based schemes; data transmission; efficient link-level error resilience; inter-die links; interleaved single error correction codes; intra-die links; link protection; link reliability; networks-on-chip; power consumption; power overheads; stacked 3D integrated systems; Automatic repeat request; Equations; Forward error correction; Reliability; Resilience; Three dimensional displays; Wires;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2012 IEEE 15th International Symposium on
  • Conference_Location
    Tallinn
  • Print_ISBN
    978-1-4673-1187-8
  • Electronic_ISBN
    978-1-4673-1186-1
  • Type

    conf

  • DOI
    10.1109/DDECS.2012.6219038
  • Filename
    6219038