Differential evolutionary optimization algorithm applied to ESD MOSFET model fitting problem

Author

Napravnik, Tomas ; Kote, Vlastimil ; Molata, Vladimir ; Jakovenko, Jiri

Author_Institution

ASICentrum s.r.o., Prague, Czech Republic

fYear

2012

fDate

18-20 April 2012

Firstpage

155

Lastpage

158

Abstract

The aim of this paper is to present the utilization of modern optimization algorithm called Differential Evolution to automatically fit the appropriate Electrostatic discharge (ESD) model to the measured data from a test chip without the need of manual model-parameter tuning, which presents very time and resource-consuming process. In this paper, the optimization procedure and the results of fitting the generic process NMOST model to the piece-wise linear I-V characteristic are presented.

Keywords

MOSFET; electrostatic discharge; evolutionary computation; optimisation; ESD MOSFET model fitting problem; differential evolution; differential evolutionary optimization algorithm; electrostatic discharge model; generic process NMOST model; piecewise linear I-V characteristic; Computational modeling; Data models; Electrostatic discharges; Hardware design languages; Integrated circuit modeling; Optimization; Vectors; Differential evolutionary optimization algorithm; ESD NMOST; ESD model fitting;

fLanguage

English

Publisher

ieee

Conference_Titel

Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2012 IEEE 15th International Symposium on

Conference_Location

Tallinn

Print_ISBN

978-1-4673-1187-8

Electronic_ISBN

978-1-4673-1186-1

Type

conf

DOI

10.1109/DDECS.2012.6219043

Filename

6219043