• DocumentCode
    2334229
  • Title

    Approaches to statistical circuit analysis for deep sub-micron technologies

  • Author

    Orshansky, Michael ; Chen, James C. ; Hu, Chenming ; Wan, Daniel ; Bendix, Peter

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA, USA
  • fYear
    1998
  • fDate
    35953
  • Firstpage
    6
  • Lastpage
    9
  • Abstract
    Difficulties of statistical circuit analysis for deep submicron CMOS technologies are discussed. The complex patterns of variation in device parameters observed make previously used methods invalid. An approach that couples the extracted SPICE parameter sets with their physical locations is advocated as an alternative
  • Keywords
    CMOS integrated circuits; SPICE; circuit analysis computing; circuit complexity; statistical analysis; CMOS technology; SPICE parameter sets; device parameter variation patterns; parameter physical locations; statistical circuit analysis; CMOS logic circuits; CMOS technology; Circuit analysis; Circuit optimization; Independent component analysis; Measurement standards; Principal component analysis; SPICE; Sampling methods; Stochastic processes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Statistical Metrology, 1998. 3rd International Workshop on
  • Conference_Location
    Honolulu, HI
  • Print_ISBN
    0-7803-4338-7
  • Type

    conf

  • DOI
    10.1109/IWSTM.1998.729753
  • Filename
    729753
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2334229