Title :
Approaches to statistical circuit analysis for deep sub-micron technologies
Author :
Orshansky, Michael ; Chen, James C. ; Hu, Chenming ; Wan, Daniel ; Bendix, Peter
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA, USA
Abstract :
Difficulties of statistical circuit analysis for deep submicron CMOS technologies are discussed. The complex patterns of variation in device parameters observed make previously used methods invalid. An approach that couples the extracted SPICE parameter sets with their physical locations is advocated as an alternative
Keywords :
CMOS integrated circuits; SPICE; circuit analysis computing; circuit complexity; statistical analysis; CMOS technology; SPICE parameter sets; device parameter variation patterns; parameter physical locations; statistical circuit analysis; CMOS logic circuits; CMOS technology; Circuit analysis; Circuit optimization; Independent component analysis; Measurement standards; Principal component analysis; SPICE; Sampling methods; Stochastic processes;
Conference_Titel :
Statistical Metrology, 1998. 3rd International Workshop on
Conference_Location :
Honolulu, HI
Print_ISBN :
0-7803-4338-7
DOI :
10.1109/IWSTM.1998.729753
