Title :
Measurement of diversity-combining performance enhancement for fast FH
Author :
Tardif, P. ; Felstead, E.B.
Author_Institution :
Commun. Res. Centre, Ottawa, Ont., Canada
Abstract :
Repetition of a symbol of L different hops can be used to decrease the error rate of fast frequency hopped (FH) signals. An experimental measurement system that uses a SAW (surface acoustic wave) demodulator and a signal processing microchip is described. The performance of hard-decision majority-vote combining (HDMV) and normalized envelope detection (NED) combining was measured in the presence of severe (down to 0-dB effective signal-to-jamming ratio) noise and multitone jamming plus system noise. HDMV combining reduced the bit-error rate (BER) reasonably well for noise jamming but gave little reduction for large multitone jamming. NED combining produced substantial reduction in BER for both forms of jamming. Neither method exhibits the failure mechanism of error-correction coding at high input BERs. The measurement system demonstrates the ease of implementation of the two combining techniques in real time. It also demonstrates that changes in L over a wide range are easily implemented
Keywords :
demodulators; digital signal processing chips; diversity reception; frequency agility; jamming; measurement systems; spread spectrum communication; surface acoustic wave devices; BER; SAW demodulator; bit-error rate; experimental measurement system; fast frequency hopped signals; hard-decision majority-vote combining; multitone jamming; noise jamming; normalised envelope detection combining; signal processing microchip; signal to jamming ratio noise; spread spectrum communication; surface acoustic wave; system noise; Acoustic measurements; Acoustic noise; Acoustic waves; Bit error rate; Demodulation; Error analysis; Frequency; Jamming; Signal to noise ratio; Surface acoustic waves;
Conference_Titel :
Military Communications Conference, 1989. MILCOM '89. Conference Record. Bridging the Gap. Interoperability, Survivability, Security., 1989 IEEE
Conference_Location :
Boston, MA
DOI :
10.1109/MILCOM.1989.103893