Title :
OBIST strategy versus parametric test - Efficiency in covering catastrophic faults in active analog filters
Author :
Arbet, Daniel ; Gyepes, Gábor ; Brenkus, Juraj ; Stopjaková, Viera
Author_Institution :
Inst. of Electron. & Photonics, Slovak Univ. of Technol., Bratislava, Slovakia
Abstract :
This paper deals with the comparison of the fault coverage of catastrophic faults in active analog integrated filter obtained by the measurement of filter parameters and by the Oscillation-based Built-In Self Test (OBIST) approach. In our experiment, firstly, the cut-off frequency, ripple in the pass band, DC gain in pass band and group delay of the filters have been monitored in the operating mode. Then, during the test mode (OBIST), the filter is transformed to an oscillator, and the oscillation frequency is compared to the frequency from a dedicated on-chip reference oscillator to compensate undesired influence of technology variations. The obtained results on the efficiency of both approaches are compared.
Keywords :
active filters; analogue circuits; built-in self test; oscillators; DC gain; OBIST strategy; active analog integrated filter; catastrophic fault; cut-off frequency; fault coverage; on-chip reference oscillator; oscillation frequency; oscillation-based built-in self test; parametric test-efficiency; ripple; Circuit faults; Low pass filters; Monitoring; Oscillators; Radiation detectors; System-on-a-chip; Oscillation-based Build-In Self Test; catastrophic faults; fault detection; mixed-signal test; parametric test;
Conference_Titel :
Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2012 IEEE 15th International Symposium on
Conference_Location :
Tallinn
Print_ISBN :
978-1-4673-1187-8
Electronic_ISBN :
978-1-4673-1186-1
DOI :
10.1109/DDECS.2012.6219053
