Combining on-line fault detection and logic self repair

In recent years many authors have addressed the growing vulnerability of nano-electronic circuits and systems to transient faults and wear-out effects. Hence present and even more future electronic systems need the property of resilience against different types of fault effects for long-term dependable operation. Fault detection, error compensation, and also repair technologies require a substantial overhead in extra hardware resources, which add to system size, cost and power consumption. In this paper we present a first attempt to combine resources for transient fault handling and for permanent fault repair in a unified approach.