• DocumentCode
    2334942
  • Title

    SURF applied in panorama image stitching

  • Author

    Juan, Luo ; Oubong Gwun

  • Author_Institution
    Comput. Graphics Lab., Chonbuk Nat. Univ., Jeonju, South Korea
  • fYear
    2010
  • fDate
    7-10 July 2010
  • Firstpage
    495
  • Lastpage
    499
  • Abstract
    SURF (Speeded Up Robust Features) is one of the famous feature-detection algorithms. This paper proposes a panorama image stitching system which combines an image matching algorithm; modified SURF and an image blending algorithm; multi-band blending. The process is divided in the following steps: first, get feature descriptor of the image using modified SURF; secondly, find matching pairs, check the neighbors by K-NN (K-nearest neighbor), and remove the mismatch couples by RANSAC(Random Sample Consensus); then, adjust the images by bundle adjustment and estimate the accurate homography matrix; lastly, blend images by multi-band blending. Also, comparison of SIFT (Scale Invariant Feature Transform) and modified SURF are also shown as a base of selection of image matching algorithm. According to the experiments, the present system can make the stitching seam invisible and get a perfect panorama for large image data and it is faster than previous method.
  • Keywords
    feature extraction; image matching; image sampling; random processes; K-NN algorithm; RANSAC; SIFT algorithm; SURF algorithm; bundle adjustment; feature detection algorithm; homography matrix; image blending algorithm; image matching algorithm; multiband blending; panorama image stitching; random sample consensus; scale invariant feature transform algorithm; speeded up robust feature; Computer vision; Equations; Feature extraction; Image matching; Lighting; Mathematical model; Robustness; LM; SURF; bundle adjustment; multi-band blending; panorama; stitching;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Image Processing Theory Tools and Applications (IPTA), 2010 2nd International Conference on
  • Conference_Location
    Paris
  • ISSN
    2154-5111
  • Print_ISBN
    978-1-4244-7247-5
  • Type

    conf

  • DOI
    10.1109/IPTA.2010.5586723
  • Filename
    5586723