Title :
Automated debugging from pre-silicon to post-silicon
Author :
Dehbashi, Mehdi ; Fey, Görschwin
Author_Institution :
Inst. of Comput. Sci., Univ. of Bremen, Bremen, Germany
Abstract :
Due to the increasing design size and complexity of modern Integrated Circuits (IC) and the decreasing time-to-market, debugging is one of the major bottlenecks in the IC development cycle. This paper presents a generalized approach to automate debugging which can be used in different scenarios from design debugging to post-silicon debugging. The approach is based on model-based diagnosis. Diagnostic traces are proposed as an enhancement reducing debugging time and increasing diagnosis accuracy. The experimental results show the effectiveness of the approach in post-silicon debugging.
Keywords :
computer debugging; elemental semiconductors; integrated circuit design; silicon; automated debugging; design size; diagnostic traces; model-based diagnosis; modern integrated circuits complexity; post-silicon; pre-silicon; Accuracy; Circuit faults; Computer bugs; Debugging; Hardware; Integrated circuit modeling;
Conference_Titel :
Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2012 IEEE 15th International Symposium on
Conference_Location :
Tallinn
Print_ISBN :
978-1-4673-1187-8
Electronic_ISBN :
978-1-4673-1186-1
DOI :
10.1109/DDECS.2012.6219082
