• DocumentCode
    2334985
  • Title

    On the use of assertions for embedded-software dynamic verification

  • Author

    Guglielmo, Giuseppe Di ; Guglielmo, Luigi Di ; Fummi, Franco ; Pravadelli, Graziano

  • Author_Institution
    Dept. of Comput. Sci., Univ. of Verona, Verona, Italy
  • fYear
    2012
  • fDate
    18-20 April 2012
  • Firstpage
    330
  • Lastpage
    335
  • Abstract
    Assertion-based verification (ABV) affirmed as an effective methodology for functional verification, i.e., design specification conformance, of embedded systems. Academia and industry have throughly investigated formal ABV for high-budget or safety-critical hardware and software projects, while the scalability of dynamic ABV has led to the introduction of standard languages and commercial tools addressing hardware design verification, emulation, and silicon debug. However, up to now, there were only limited studies concerning the application of dynamic ABV to embedded-software design and verification flow. We propose an analysis aiming to bridge such a gap. In particular, we illustrate how dynamic ABV can integrate and improve the various stages of the embedded-software verification flow. The analysis leads us to develop a comprehensive ABV environment that integrates the still missing automatic synthesis of executable checkers for embedded software. Experiments show that the proposed environment reduces the verification-team efforts and makes dynamic ABV practical for embedded-software design.
  • Keywords
    embedded systems; formal specification; formal verification; assertion-based verification; design specification conformance; dynamic ABV; embedded system; embedded-software design; embedded-software dynamic verification; embedded-software verification flow; executable checker; formal ABV; functional verification; hardware design emulation; hardware design verification; silicon debug; Embedded software; Hardware; Hysteresis; Monitoring; Temperature; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2012 IEEE 15th International Symposium on
  • Conference_Location
    Tallinn
  • Print_ISBN
    978-1-4673-1187-8
  • Electronic_ISBN
    978-1-4673-1186-1
  • Type

    conf

  • DOI
    10.1109/DDECS.2012.6219083
  • Filename
    6219083