• DocumentCode
    2335146
  • Title

    VARMA—VARiability modelling and analysis tool

  • Author

    Russell, G. ; Burns, F. ; Yakovlev, A.

  • Author_Institution
    Sch. of Electr., Electron. & Comput. Eng., Newcastle Univ., Newcastle upon Tyne, UK
  • fYear
    2012
  • fDate
    18-20 April 2012
  • Firstpage
    378
  • Lastpage
    383
  • Abstract
    Process parameter variability in IC manufacturing has become an increasingly important issue as feature scaling descends further into the deep submicron region. Within industry the development of EDA tools associated with “process-aware-design” has a high priority as the impact on circuit performance due to process variations is having increasingly adverse effects on yield and performance. VARMA is a variability analysis tool which enables optimisation of both manufacturing process and nano-electronic circuit design in order to avoid `manufacturing surprises´ resulting in costly chip respins, delays in reaching the market place and the subsequent loss of profitability.
  • Keywords
    VLSI; circuit optimisation; integrated circuit design; integrated circuit manufacture; nanoelectronics; EDA tools; IC manufacturing; VARMA; VLSI design; deep submicron region; delays; nanoelectronic circuit design; process parameter variability modelling; process-aware-design; variability analysis tool; Analytical models; Circuit optimization; Delay; Integrated circuit modeling; Manufacturing processes; US Department of Energy; CAD tools; VLSI design; process variability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2012 IEEE 15th International Symposium on
  • Conference_Location
    Tallinn
  • Print_ISBN
    978-1-4673-1187-8
  • Electronic_ISBN
    978-1-4673-1186-1
  • Type

    conf

  • DOI
    10.1109/DDECS.2012.6219091
  • Filename
    6219091