DocumentCode
2335146
Title
VARMA—VARiability modelling and analysis tool
Author
Russell, G. ; Burns, F. ; Yakovlev, A.
Author_Institution
Sch. of Electr., Electron. & Comput. Eng., Newcastle Univ., Newcastle upon Tyne, UK
fYear
2012
fDate
18-20 April 2012
Firstpage
378
Lastpage
383
Abstract
Process parameter variability in IC manufacturing has become an increasingly important issue as feature scaling descends further into the deep submicron region. Within industry the development of EDA tools associated with “process-aware-design” has a high priority as the impact on circuit performance due to process variations is having increasingly adverse effects on yield and performance. VARMA is a variability analysis tool which enables optimisation of both manufacturing process and nano-electronic circuit design in order to avoid `manufacturing surprises´ resulting in costly chip respins, delays in reaching the market place and the subsequent loss of profitability.
Keywords
VLSI; circuit optimisation; integrated circuit design; integrated circuit manufacture; nanoelectronics; EDA tools; IC manufacturing; VARMA; VLSI design; deep submicron region; delays; nanoelectronic circuit design; process parameter variability modelling; process-aware-design; variability analysis tool; Analytical models; Circuit optimization; Delay; Integrated circuit modeling; Manufacturing processes; US Department of Energy; CAD tools; VLSI design; process variability;
fLanguage
English
Publisher
ieee
Conference_Titel
Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2012 IEEE 15th International Symposium on
Conference_Location
Tallinn
Print_ISBN
978-1-4673-1187-8
Electronic_ISBN
978-1-4673-1186-1
Type
conf
DOI
10.1109/DDECS.2012.6219091
Filename
6219091
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