DocumentCode
2335519
Title
Stability of electrohydrodynamic induction pumping of a stratified liquid/vapor medium in the presence of an external load
Author
Wawzyniak, M. ; Seyed-Yagoobi, J.
Author_Institution
Dept. of Mech. Eng., Texas A&M Univ., College Station, TX, USA
Volume
3
fYear
1998
fDate
12-15 Oct. 1998
Firstpage
1828
Abstract
A stability analysis of electrohydrodynamic induction pumping of a stratified liquid/vapor medium incorporating an external load is carried out in nondimensional form. General stability criteria are introduced for attraction and repulsion mode pumping. Stability is found to depend on dimensionless geometric parameters of the pump as well as dimensionless electric parameters of the working fluid. The criteria are investigated in detail, considering two specific cases each of attraction and repulsion mode pumping. Parameter maps are presented indicating regions of stable and unstable operation for each case. Finally, the effect of the dimensionless electric wave angular velocity on the dimensionless interfacial velocity is studied for selected stable and unstable cases. It is shown that unstable pumps can be stabilized through careful selection of the involved parameters and that the overall performance of the pump is likely to be improved in the process.
Keywords
electrohydrodynamics; electromagnetic induction; flow instability; pumps; stratified flow; attraction mode pumping; dimensionless electric parameters; dimensionless electric wave angular velocity; dimensionless geometric parameters; dimensionless interfacial velocity; electrohydrodynamic induction pumping; external load; parameter selection; pump performance; repulsion mode pumping; stability analysis; stability criteria; stratified liquid/vapor medium; working fluid; Angular velocity; Conductivity; Electrodes; Electrohydrodynamics; Frequency; Mechanical engineering; Permittivity; Pumps; Stability analysis; Stability criteria;
fLanguage
English
Publisher
ieee
Conference_Titel
Industry Applications Conference, 1998. Thirty-Third IAS Annual Meeting. The 1998 IEEE
Conference_Location
St. Louis, MO, USA
ISSN
0197-2618
Print_ISBN
0-7803-4943-1
Type
conf
DOI
10.1109/IAS.1998.729831
Filename
729831
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