• DocumentCode
    2335722
  • Title

    Radial ion diffusion induced by cyclotron resonance heating at the thermal barrier region in the Phaedrus-B tandem mirror

  • Author

    Wen, Yu-Jou ; Brouchous ; Ichimura, Makoto ; Breun ; Hershkowitz, Noah ; Probert ; Majeski, R. ; Intrator, T. ; Roberts, David ; Keil

  • Author_Institution
    Wisconsin Univ., Madison, WI, USA
  • fYear
    1989
  • fDate
    0-0 1989
  • Firstpage
    117
  • Lastpage
    118
  • Abstract
    Summary Form only given, as follows. Experiments with and without ion cyclotron resonance (1.275 MHz, fundamental ion cyclotron frequency of hydrogen plasma) as the thermal-barrier region have been carried out by varying the thermal-barrier magnetic field strength. Radial density profiles, potential profiles, and currents have been measured, as well as the fueling at the thermal-barrier region. The density at the plasma edge increased and the potential at the plasma edge decreased as the B field was decreased to bring the resonance into the thermal-barrier cell in both a balanced and imbalanced gas-puffing case. The data indicated that a possible mechanism is that ions can escape from the confinement region along the open resonance surface (the same as the mod-B surfaces) because the turning point of the trapped ions has a tendency to center on mod-B surfaces. An increasing potential observed in the present experiments in the edge region of the plasma with increasing B field may be related to the higher degree of fluctuation of radial current to the collector.<>
  • Keywords
    fluctuations; magnetic mirrors; plasma confinement; plasma density; plasma radiofrequency heating; plasma transport processes; 1.275 MHz; Phaedrus-B; collector; confinement; cyclotron resonance heating; density profiles; fluctuation; fueling; gas-puffing case; ion cyclotron resonance; ion diffusion; magnetic field strength; mod-B surfaces; open resonance surface; plasma edge; potential profiles; radial current; tandem mirror; thermal barrier region; trapped ions; turning point; Charge carrier processes; Electromagnetic heating; Plasma confinement; Plasma heating; Plasma properties;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Plasma Science, 1989. IEEE Conference Record - Abstracts., 1989 IEEE International Conference on
  • Conference_Location
    Buffalo, NY, USA
  • Type

    conf

  • DOI
    10.1109/PLASMA.1989.166172
  • Filename
    166172